沟槽
二极管
肖特基二极管
光电子学
材料科学
肖特基势垒
电压
不稳定性
金属半导体结
频道(广播)
电气工程
凝聚态物理
物理
工程类
纳米技术
机械
图层(电子)
作者
Hyun‐Seop Kim,Aditya K. Bhat,Matthew D. Smith,Martin Kuball
标识
DOI:10.1109/ted.2024.3393941
摘要
Turn-on voltage instability of beta-gallium oxide ($\beta $-Ga2O3) vertical trench Schottky barrier diodes (SBDs) with different fin-channel orientations was investigated. Fins oriented along the [010] direction exhibited the highest turn-on voltage stability and the smallest hysteresis, while fin channels oriented along the [100] direction exhibited the greatest instability. This study suggests that charge trapping at the sidewalls of$\beta $-Ga2O3 trench SBDs differs based on the fin channel orientation and that fin channels oriented along the [010] direction possess the best electrical characteristics and reliability.
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