拉曼光谱
表征(材料科学)
材料科学
范德瓦尔斯力
光谱学
半导体
平面(几何)
纳米技术
热电效应
光电子学
光学
物理
分子
量子力学
几何学
数学
作者
Liang Fang,Hejun Xu,Xing Wu,Chaolun Wang,Chen Luo,Jian Zhang
出处
期刊:Chinese Physics B
[IOP Publishing]
日期:2018-03-01
卷期号:27 (3): 037802-037802
被引量:52
标识
DOI:10.1088/1674-1056/27/3/037802
摘要
Two-dimensional (2D) materials have become a hot study topic in recent years due to their outstanding electronic, optical, and thermal properties. The unique band structures of strong in-plane chemical bonds and weak out-of-plane van der Waals (vdW) interactions make 2D materials promising for nanodevices and various other applications. Raman spectroscopy is a powerful and non-destructive characterization tool to study the properties of 2D materials. In this work, we review the research on the characterization of 2D materials with Raman spectroscopy. In addition, we discuss the application of the Raman spectroscopy technique to semiconductors, superconductivity, photoelectricity, and thermoelectricity.
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