光电二极管
电阻抗
电容
材料科学
硅
失真(音乐)
光电子学
介电谱
分析化学(期刊)
光学
化学
物理
电极
放大器
CMOS芯片
电化学
量子力学
色谱法
物理化学
作者
Habibe Bayhan,Şadan Özden
出处
期刊:Semiconductors
[Springer Nature]
日期:2007-03-01
卷期号:41 (3): 353-356
被引量:3
标识
DOI:10.1134/s1063782607030207
摘要
The dark alternating current (ac) parameters of BPW34 and BPW41 (Vishay-Telefunken) silicon p-i-n photodiodes are measured and compared at different temperatures using the impedance spectroscopy technique. The impedance plots are nearly semicircular and typically distorted on the high frequency side. For BPW41, the distortion apparently arises from one of the two interfaces as expected for a typical p-i-n device. However, for BPW34, the presence of the distortion is attributed to the variation of photodiode capacitance and resistance with measurement frequency.
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