The anodic oxidation of valve metals—III Transport processes and their correlation with film contamination by fluoride as measured by XPS

The effect of fluoride ion incorporation on the ionic transport processes during anodic oxidation of zirconium has been studied using an α-particle spectrometry technique. X-ray photo-electron spectroscopy (XPS) measurements permit correlation between oxide composition and changes in oxide properties. The incorporated fluoride ions appear to affect the oxide growth field, but not the ionic transport numbers.