铁电性
材料科学
凝聚态物理
软模式
太赫兹辐射
声子
外延
放松(心理学)
相变
电介质
电场
物理
纳米技术
光电子学
量子力学
社会心理学
心理学
图层(电子)
作者
V. Skoromets,Christelle Kadlec,Jan Drahokoupil,J. Schubert,J. Hlinka,P. Kužel
标识
DOI:10.1103/physrevb.89.214116
摘要
Epitaxial heterostructures consisting of a variable number of ${\mathrm{SrTiO}}_{3}/{\mathrm{DyScO}}_{3}$ bilayers deposited on ${\mathrm{DyScO}}_{3}$ substrates were investigated using time-domain terahertz spectroscopy down to helium temperatures. Interdigitated electrodes deposited on top of the structures allowed probing of the terahertz response upon an applied electric field. The phase transition into a ferroelectric state is observed in ${\mathrm{SrTiO}}_{3}$ films in all samples close to room temperature (between 250 and 310 K) due to in-plane epitaxial strain induced by the substrate and intercalated layers of ${\mathrm{DyScO}}_{3}$. Evolution of the dielectric spectra with temperature and external electric field is described by a general model which involves a damped harmonic oscillator (soft mode) coupled to a Debye relaxation (central mode). Both modes are connected with the soft mode eigenvector, as recently shown by molecular dynamics simulations, and they reflect a strong anharmonicity of the soft-mode potential. At high temperatures the soft-mode frequency variation drives all the changes observed in the spectra with temperature and applied field. At low temperatures, deep in the ferroelectric phase, the soft mode significantly hardens and loses its importance for the terahertz dynamics; the central mode becomes stronger and it almost completely determines the shape of the measured spectra. The observed variation of phase transition temperature and of the dielectric response among the structures is ascribed to a partial epitaxial strain relaxation confirmed also by x-ray diffraction.
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