MOSFET
材料科学
光电子学
电气工程
工程物理
物理
工程类
晶体管
电压
作者
Shiguang Shang,Yuan He,Haoran Wu,Xinkai Chen
标识
DOI:10.1109/isset62871.2024.10779940
摘要
In this paper, a 4H-SiC dual-trench metal-oxide-semiconductor field effect transistor with shielded-gate and superjunction (DT/SJ-SGTMOS) is proposed. Due to the shielded gate structure at the gate trench, the gate-drain overlap area of the device is reduced. The switching speed of the device is improved. In addition, the P-pillar and the $\mathrm{N}^{+}$-drift form a superjunction structure, which reduces the specific on-resistance $(R_{\text{on},\text{sp}})$ and improves the breakdown voltage (BV). Compared with 4H-SiC superjunction dual-trench MOSFET (DT-SJMOS), the DT/SJ-SGTMOS has higher BV, faster switching speed, and superior dynamic and static performance.
科研通智能强力驱动
Strongly Powered by AbleSci AI