微流变学
粘弹性
流变学
材料科学
聚合物
长度刻度
示踪剂
显微镜
化学物理
图层(电子)
纳米技术
复合材料
机械
光学
化学
物理
核物理学
作者
D. T. Chen,Eric R. Weeks,John C. Crocker,Mohammad F. Islam,Ritu Verma,Josh J. Gruber,Alex J. Levine,T. C. Lubensky,Arjun G. Yodh
标识
DOI:10.1103/physrevlett.90.108301
摘要
We demonstrate how tracer microrheology methods can be extended to study submicron scale variations in the viscoelastic response of soft materials; in particular, a semidilute solution of lambda-DNA. The polymer concentration is depleted near the surfaces of the tracer particles, within a distance comparable to the polymer correlation length. The rheology of this microscopic layer alters the tracers' motion and can be precisely quantified using one- and two-point microrheology. Interestingly, we found this mechanically distinct layer to be twice as thick as the layer of depleted concentration, likely due to solvent drainage through the locally perturbed polymer structure.
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