异质结
钙钛矿(结构)
材料科学
开尔文探针力显微镜
光伏系统
伏打电位
光电子学
载流子
卤化物
图层(电子)
纳米尺度
纳米技术
原子力显微镜
电气工程
无机化学
化学
结晶学
工程类
作者
Chunyan Lu,Ziyang Hu,Yanyan Wang,Kai Sun,Baihui Shen,Can Gao,Cheng Yang,Jing Zhang,Yuejin Zhu
标识
DOI:10.1002/admi.201801253
摘要
Abstract Hybrid halide perovskite based on CH 3 NH 3 PbI 3 and related materials has emerged as the most exciting development in the next generation photovoltaic technologies. There is still requirement for an effective method to establish a relationship between the charge transfer behaviors and photovoltaic properties. This study presents Kelvin probe force microscopy and conductive atomic force microscopy measurements of versatile perovskite films that participate in the formation of different heterojunctions, exploring local current, contact potential difference (CPD), and charge activities at the nanoscale. By comparing the values of CPD and current of these perovskite films in dark and under illumination, the charge transfer behaviors are locally illustrated, suggesting that the perovskite roles in these heterojunctions are strictly dependent on the contact layers. Furthermore, the average difference (Δ V ) of the CPD values obtained in dark and under illumination for each heterojunction can be set to analyze the efficacy of the perovskite/contact layer interfaces. The Δ V polarity is related to the type of charge carrier (hole or electron), while the Δ V magnitude is related to the number of charge carrier. These results emphasize the importance of understanding of these heterojunction systems that could guide the design and optimization of the photovoltaic configuration.
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