材料科学
折射率
衰减系数
光电子学
蓝宝石
带隙
透射率
吸收边
吸收(声学)
金属有机气相外延
合金
高折射率聚合物
薄膜
氮化物
光学
激光器
图层(电子)
外延
复合材料
物理
纳米技术
作者
John F. Muth,J.D. Brown,Mark A. Johnson,Zhonghai Yu,R. M. Kolbas,J. W. Cook,J. F. Schetzina
出处
期刊:Mrs Internet Journal of Nitride Semiconductor Research
[Materials Research Society]
日期:1999-01-01
卷期号:4 (S1): 502-507
被引量:141
标识
DOI:10.1557/s1092578300002957
摘要
The design of optoelectronic devices fabricated from III-nitride materials is aided by knowledge of the refractive index and absorption coefficient of these materials. The optical properties of GaN, AlN and AlGaN grown by MOVPE on sapphire substrates were investigated by means of transmittance and reflectance measurements. Thin (less than 0.5 μm) single crystal films were employed to insure that transmission measurements could be obtained well above the optical band gap. The influence of alloy broadening on the absorption edge was investigated by using a series of AlGaN alloy samples with a range of Al compositions. The optical absorption coefficient above the band gap was obtained for AlGaN having up to 38% Al composition. The refractive index below the band gap was determined for the same series of samples. These properties provide information critical to the optimal design of solar blind detectors or other optoelectronic devices.
科研通智能强力驱动
Strongly Powered by AbleSci AI