材料科学
电极
光电子学
光刻
电介质
纳米颗粒
薄膜晶体管
薄膜
纳米技术
图层(电子)
物理化学
化学
作者
Julia Reker,Thorsten Meyers,Fábio Fedrizzi Vidor,Ulrich Hilleringmann
摘要
This study focuses on the integration of copper oxide nanoparticles forming inorganic p-channel thin-film transistors (TFTs). The used CuO nanoparticles have a diameter of 25-55 nm and are dispersed in a water-based solution providing the opportunity of low-cost and large-scale integration processes. First investigations were realized using an inverted coplanar TFT architecture due to the low chemical and physical stresses the semiconductor has to withstand. Therefore, a gate electrode consisting of 50 nm aluminum followed by 7 nm titanium was integrated on a Si/SiO2 substrate. As gate dielectric a high-k organic-inorganic nanocomposite was deposited by spin-coating resulting in a layer thickness of 150- 180 nm. For the drain and source electrodes gold and nickel were examined. For both metallizations the influence of an electrode treatment with a self-assembling monolayer (2,3,4,5,6 Pentafluorothiophenol, PFBT) was investigated. The gate metallization as well as the drain/source electrodes were evaporated via e-beam and structured by photolithography followed by wet-etching processes and lift-off technique, respectively. In the last step, the CuO nanoparticle layer was applied by doctor blade process followed by evaporating the solvent in a convection oven under ambient conditions. The maximum temperature during the integration process was 115°C so that a compatibility to glass and foil substrates is given. The influence of the drain/source material on the electrical characteristics was explored as well as the impact of the electrode treatment. Besides single TFTs inorganic inverter circuits in complementary technique were analyzed.
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