外延
材料科学
等离子体
化学气相沉积
大气压力
大气压等离子体
基质(水族馆)
沉积(地质)
等离子体处理
光电子学
半导体
杂质
分析化学(期刊)
化学工程
纳米技术
环境化学
化学
图层(电子)
气象学
有机化学
海洋学
物理
地质学
工程类
古生物学
生物
量子力学
沉积物
作者
Chang-Hun Song,Hwa-Yeon Ryu,H. Oh,Seung Jae Baik,Dae-Hong Ko
标识
DOI:10.1149/2162-8777/acabe4
摘要
Atmospheric pressure (AP) plasma provides an alternative approach to low-cost thin-film deposition. The low throughput of epitaxial growth, which limits productivity in semiconductor manufacturing, can be addressed by using AP plasma. In principle, AP plasma does no damage and enables local heating of the deposition surface. In Si epitaxial growth using AP plasma, hydrogen incorporation and quiescent gas flow are shown to be key factors controlling epitaxial growth even under a high environmental impurity flux and at a low substrate temperature of 150 °C. Quiescent plasma at AP is promising for future epitaxial processing owing to its low cost and high productivity.
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