Lifetime measurement and aging mechanism analysis of OLED subpixels

• Demonstrated a lifetime testing method for the subpixels on the OLED displays. • The spectra of specific RGB subpixels could be measured simultaneously. • The aging mechanism of RGB subpixels were analyzed systematically. • A detailed lifetime prediction was made for a commercial subpixel OLED. The lifetime of organic light-emitting diodes (OLED) is of great importance for both display and lighting applications. In order to measure the brightness attenuation of each subpixel on the OLED screen at the same time, an experimental platform was built with a spectrometer and an automatic mechanical system. By testing the brightness decay rate of red, green, blue, and white light from the OLED screen under different initial brightness, combined with data fitting using the extended exponential decay model, the aging mechanism of each subpixel is compared and analyzed. The comparative analysis results show that the lifetime of the OLED obeys an exponential decay distribution, and which of the blue light has the fastest decay rate within a reasonable time range. These testing and analysis methods could provide reference and guidance for OLED manufacturers and users.