High-Performance Monolayer-2D Stacked Nanosheet FETs with High ION~ 451 μA/μm and ION/IOFF > 109
纳米片
单层
材料科学
光电子学
物理
纳米技术
作者
Fengben Xi,Himanshu Sharma,Xiangyu Wu,Devin Verreck,Daire Cott,Robert K. Grubbs,Tien Dat Ngo,Pawan Kumar,P. Morin,Benjamin Groven,Jean‐François de Marneffe,Dennis H. van Dorp,Souvik Ghosh,Zaoyang Lin,Ankit Nalin Mehta,Zhuo Chen,Surajit Sutar,T. Schram,Quentin Smets,Dennis Lin
In this work, stacked nanosheet FETs with monolayer MoS2 channels are presented. At a channel length of 40 nm, the transistor exhibits a remarkable $\mathrm{I}_{\text{ON}}-451\ \mu \mathrm{A}/\mu \mathrm{m}$ at $\mathrm{V}_{\text{DS}}=1\ \mathrm{V}$, achieved with two tiers of monolayer-MoS2 channels. The device has a record $\mathrm{I}_{\text{ON}}/\mathrm{I}_{\text{OFF}} > 10^{9}$ and a yield of 96.59%, which shows good electro-static control in the nanosheet channels. We compare these results to dual gate 2D FETs and show how learnings on the planar devices can be utilized in a gate-all-around case. The successful demonstration of stacked 2D nanosheet FETs with high performance further extends Moore's Law scaling with the future 2D CFETs application.