X射线光电子能谱
极地的
方向(向量空间)
X射线
分子
光谱学
材料科学
化学极性
结晶学
原子物理学
化学
核磁共振
物理
光学
几何学
天文
量子力学
数学
有机化学
作者
V. K. Makarov,Ratibor G. Chumakov,A. M. Lebedev,V. G. Stankevich
标识
DOI:10.1134/s1063774522060165
摘要
A submonolayer film of fullerene fluoride C60F18 on the surface of an Au(111) single crystal has been analyzed by excitation-energy-resolved X-ray photoelectron spectroscopy. An analysis of the experimental data according to the model taking into account the photoelectron escape depth from the sample makes it possible to identify the orientation of C60F18 dipole molecules with respect to the substrate surface.
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