Atomic-scale imaging of electron sensitive zeolites with aberration corrected transmission electron microscopy

The spatial resolution of transmission electron microscopes (TEMs) and scanning transmission electron microscopes (STEMs) has been drastically improved by introducing aberration correction. However, observable range in electron sensitive zeolites are still limited due to electron irradiation damages. Nevertheless, atomic resolution imaging of some zeolites is currently being realized by various developments in electron microscopic hardware, such as high sensitivity cameras. On the other hand, surveying the status of TEM and STEM imaging is very important for further progress in the structural analysis of zeolites. Here, we demonstrate and compare the high-resolution imaging of zeolites with several kinds of imaging modes.