反射高能电子衍射
电子衍射
衍射
反射(计算机编程)
扫描隧道显微镜
曲面(拓扑)
简单(哲学)
材料科学
光学
结晶学
纳米技术
凝聚态物理
物理
化学
计算机科学
数学
几何学
程序设计语言
哲学
认识论
作者
M. G. Lagally,Don Savage,Michael C. Tringides
出处
期刊:NATO advanced study institutes series
日期:1988-01-01
卷期号:: 139-174
被引量:39
标识
DOI:10.1007/978-1-4684-5580-9_11
摘要
Reflection high-energy electron diffraction (RHEED) is just one of several diffraction techniques (electron, atom, or x-ray) that have the capability for investigating the crystallography and microstructure of surfaces and very thin films. Diffraction gives a statistical view of disorder rather than a local picture, as would be obtained, for example, in a scanning tunneling microscope. Many processes occurring at surfaces, such as growth, phase transformations, the formation of steps, and so on, involve deviations from perfect order that are stochastic in nature. For such processes a statistical view is appropriate and is directly relatable in a quantitative way to the mechanisms that are involved. All such phenomena can be broadly classified under surface disorder. This paper attempts to review how diffraction, and in particular RHEED, can be used to investigate surface disorder. The intent here is to provide a simple, physically reasonable, pedagogical approach to this subject.[1] We somewhat artificially divide the paper into static phenomena (Sec. II), time-dependent phenomena (Sec. III), and (Sec. IV) issues that complicate the simple picture presented in Secs. II and III. In this section we treat preliminary topics.
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