材料科学
掺杂剂
兴奋剂
薄膜
化学工程
工程物理
纳米技术
光电子学
工程类
作者
Min Hyuk Park,Tony Schenk,Chris M. Fancher,Everett D. Grimley,Chuanzhen Zhou,Claudia Richter,James M. LeBeau,Jacob L. Jones,Thomas Mikolajick,Uwe Schroeder
摘要
Quantitative phase analysis is first performed on doped Hafnia films to elucidate the structural origin of unexpected ferroelectricity.
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