剥脱关节
液氮
氮气
低温学
材料科学
比例(比率)
纳米技术
化学
石墨烯
有机化学
物理
热力学
量子力学
作者
Xiaoxiao Zheng,Lei Han,Sabeen Fatima,Safia Khan,Yu Sun,Ziheng Li,Yafei Ning,Klaus Leifer,Gengchang Zhu,Hu Li,Aimin Song
出处
期刊:Nano Letters
[American Chemical Society]
日期:2025-06-11
卷期号:25 (25): 9967-9975
被引量:9
标识
DOI:10.1021/acs.nanolett.5c01548
摘要
Transition metal dichalcogenides (TMDCs) hold significant promise in constructing next-generation high-performance electronic devices, potentially extending Moore's law and enabling the realization of three-dimensional integrated circuit architectures. However, realizing this potential depends critically on developing a reliable method to transfer TMDCs from a growth substrate to desirable surfaces. Here, we report a dry-transfer strategy of liquid nitrogen-assisted cryogenic exfoliation to achieve large-scale and superclean transfer of TMDCs. Benefited from the synergistic effect of liquid nitrogen-induced exfoliation and protection of hafnium oxide, the transferred TMDCs are free from polymer residues and show excellent electrical property, and taking n-type single-crystal molybdenum disulfide as a demonstration, the transferred TMDC exhibits high carrier mobility up to 38.4 cm2 V-1 s-1. Moreover, this transfer method shows versatile capabilities in transferring monolayer and multilayer TMDCs and constructing bi- and trilayer heterostructures. Therefore, our proposed transfer methodology promises the integration of TMDCs into future, ultimately scaled-down, electronic device technologies.
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