像素
光子计数
光学
雪崩二极管
二极管
单光子雪崩二极管
光电子学
波长
暗电流
点间距
材料科学
砷化镓
砷化铟镓
击穿电压
光子
图像传感器
偏压
标准差
探测器
雪崩光电二极管
电压
物理
数学
统计
量子力学
作者
Pascal Rustige,Patrick Runge,Martin Schell
摘要
We present a 96x96 InGaAs/InP single photon avalanche diode (SPAD) array for detection at 1550nm wavelength. The pixels have a diameter of 15μm and a 25μm pitch, resulting in a fill factor of 28.3%. The dark count rates (DCR) of the array were measured for a subset of 6x24 pixels. The DCR vs. photon detection efficiency of a representative SPAD and the breakdown voltage statistics for a subset of 6x96 pixels were recorded at room temperature. The DCR of the measured subset has a median value of very low 87kcps. At corresponding excess bias, we measured a photon detection efficiency (PDE) of 15%. The breakdown voltage of the 6x96 subset has a median value of 62.2V with a standard deviation of only 72mV. The results indicate a strong candidate for a SWIR imaging sensor in low-level-light applications.
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