反褶积
衍射
材料科学
寄生虫寄主
粉末衍射
卷积(计算机科学)
滤波器(信号处理)
系列(地层学)
钨
分析化学(期刊)
光学
结晶学
物理
化学
色谱法
地质学
古生物学
机器学习
万维网
计算机科学
人工神经网络
冶金
计算机视觉
作者
Takashi Ida,Shoki Ono,Daiki Hattan,Takehiro Yoshida,Yoshinobu Takatsu,Katsuhiro Nomura
出处
期刊:Powder Diffraction
[Cambridge University Press]
日期:2018-06-01
卷期号:33 (2): 108-114
被引量:3
标识
DOI:10.1017/s0885715618000337
摘要
Four series of small parasite peaks observed in powder diffraction data recorded with a Cu-target X-ray tube and a Ni filter on the diffracted beam side in Bragg–Brentano geometry are investigated. One series of the parasite peaks is assigned to the tungsten Lα -emission. Other three types of the parasite peak series are likely to be caused by the K -emissions of Ni, but the peak locations are deviated from those predicted by the Bragg's law. An empirical formula to locate the parasite peaks and a method to remove them from observed powder diffraction data are proposed. The method is based on the whole-pattern deconvolution–convolution treatment on the transformed scale of abscissa. The parameters optimized for the diffraction data measured for Si powder has been applied on treatment of the data of LaB 6 powder recorded under the same experimental conditions. It has been confirmed that the parasite peaks in the observed data can effectively be removed by the deconvolution treatment with parameters determined by a reference measurement.
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