吸收率
材料科学
反射率
光学
吸收(声学)
蒸发
硅
衰减系数
曲面(拓扑)
金属
表面光洁度
谱线
杂质
吸收光谱法
兴奋剂
光电子学
积分球
分子物理学
灵敏度(控制系统)
分析化学(期刊)
可见光谱
电介质
表面粗糙度
作者
Preston Bohm,Mingjun Li,Akanksha K. Menon,Zhuomin M. Zhang
标识
DOI:10.48550/arxiv.2603.17977
摘要
The photomolecular effect has been hypothesized to enhance evaporation of water at visible wavelengths. This study develops a measurement technique to investigate its presence and magnitude at the liquid-vapor interface of water. The experiment detects surface absorptance by comparing polarized reflectance for substrates with and without a water layer. The reflectance ratio is used as an indicator of interfacial absorptance or attenuation. Lightly doped silicon and platinum were used as dielectric and metal substrates, and their pseudo-optical properties were measured using ellipsometry. Experimental results were compared to a multilayer reflectance model to determine theoretical sensitivity and guide angle selection. Measurements showed close agreement with a classical model assuming zero surface absorptance. The model was then extended to include surface absorptance using a spectral response based on Lorentzian-distributed Feibelman parameters derived from a recent estimate of 0.84% interfacial absorption. Although this model predicted a 1-2% reduction in reflectance near resonant frequencies, no such spectral features were observed experimentally. These results suggest that under ambient conditions, interfacial absorption is well below 1%, indicating that the optical signature of the photomolecular effect is either much weaker than previously reported or strongly dependent on conditions not present in this experiment.
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