塞贝克系数
单晶
半导体
材料科学
电阻率和电导率
退火(玻璃)
带隙
凝聚态物理
半导体材料
电子迁移率
结晶学
光电子学
热导率
化学
电气工程
物理
工程类
复合材料
作者
Shrabanee Sen,D. N. Bose
标识
DOI:10.1016/0038-1098(84)90055-3
摘要
Electrical conductivity and thermopower measurements are reported for the defect semiconductors p-In2Te3 and n-Ga2Te3. The hole mobility μp in the former varied as Tn where n=+5.98 for T<350 K and n=-4.13 for T>350 K showing a maximum of 210 cm2V-1 sec-1 at 350 K. Electron mobility in n-Ga2Te3 also went through a maximum at 320 K. The optical band-gaps for both were found to be direct, with values of 1.01 and 1.08 eV for In2Te3 and Ga2Te3 respectively at 300 K. Pronounced effects of annealing on TEP and optical absorption gave evidence of defect ordering at low temperatures followed by defect creation at T>350 K.
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