硼
砷化镓
材料科学
砷化物
掺杂剂
晶体生长
电子迁移率
外延
大气温度范围
微晶
Crystal(编程语言)
电阻率和电导率
半导体
分析化学(期刊)
结晶学
化学
兴奋剂
光电子学
纳米技术
冶金
热力学
工程类
有机化学
物理
程序设计语言
色谱法
计算机科学
图层(电子)
电气工程
作者
T. L. Chu,A. E. Hyslop
摘要
Boron arsenide, a semiconductor with an energy gap of 1.46 eV, decomposes irreversibly at temperatures above 900 °C, thus limiting the temperature of the crystal growth process. In this work, single crystals of boron arsenide, identified by the x-ray diffraction method, have been prepared by the chemical transport of polycrystalline boron arsenide in the presence of a temperature gradient. The transported crystals are p type and have a resistivity of approximately 0.01 Ω cm in the temperature range 77–500 °K. The hole concentration and Hall mobility, essentially independent of temperature in the range 77–300 °K, have been estimated to be in the ranges of 1018–1019 cm−3 and 100–400 cm2V−1sec−1, respectively. In spite of the high carrier concentrations, the transported crystals are suitable as substrates for the epitaxial growth of boron arsenide with controlled dopant distribution.
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