DISCUSSION AND PRACTICE ON THE MICRO-COMPUTERIZED UPGRADING OF X-RAY DIFFRACTOMETER

In this paper, a micro-computerized upgrading method for old model x-ray diffractometer, as well as its data collection and analysis system (XRDS) are recommended. The system would save and process the diffraction data as files. The results can be displayed or printed in the form of peak data or scan data table. The original recording system can still work independently. The structure of the system is simple, and the mechanical precision of the device can be fully exploited. The upgrading work can be achieved by only connecting a few pairs of signal lines and therefore the cost is low. The method is suitable for any old model x-ray diffractometer.