可靠性(半导体)
材料科学
激光器
失效模式及影响分析
失效物理学
光电子学
半导体激光器理论
降级(电信)
可靠性工程
电致发光
砷化镓
功率(物理)
电子工程
光学
物理
半导体
工程类
复合材料
量子力学
图层(电子)
作者
Yongkun Sin,Sean C. Stuart,Stephen LaLumondiere,Miles Brodie,Zachary Lingley
摘要
High-power laser manufacturers often perform accelerated multi-cell life-tests by applying significant amounts of stresses to lasers to generate failures in relatively short test durations and then use an empirical model to estimate lifetimes of the lasers. A drawback of this approach is overestimation of lifetimes at usage conditions due to the lack of failures generated under intermediate and low stress conditions. Many groups have studied reliability and degradation processes in GaAs-based lasers, but none of these studies have yielded a reliability model based on physics of failure. The lack of such model is a concern for space applications where complete understanding of degradation mechanisms is necessary. Furthermore, our group reported a new failure mode in multi-mode and single-mode InGaAs-AlGaAs strained QW lasers in 2009 and 2016, respectively. Our group also reported in 2017 that bulk failure due to catastrophic optical bulk damage (COBD) is the dominant failure mode of both SM and MM lasers. For the present study, we performed physics of failure (PoF) investigation to develop a PoF-based reliability model. Our physics of failure investigation consisted of (i) a series of long-term and short-term life-tests that exclusively generated COBD failures and (ii) destructive and non-destructive failure analyses using electron beam induced current, time-resolved electroluminescence, time-resolved photoluminescence, focused ion beam, highresolution TEM, and deep level transient spectroscopy.
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