功勋
晶体管
电气工程
功率(物理)
电容
电压
物理
光电子学
材料科学
拓扑(电路)
工程类
电极
量子力学
作者
Yuhao Zhang,Min Sun,Joshua Perozek,Zhihong Liu,Ahmad Zubair,Daniel Piedra,Nadim Chowdhury,Xiang Gao,Kenneth L. Shepard,Tomás Palacios
标识
DOI:10.1109/led.2018.2880306
摘要
This letter presents the first experimental study on capacitances, charges, and power-switching figure of merits (FOM) for a large-area vertical GaN power transistor. A 1.2-kV, 5-A GaN vertical power FinFET was demonstrated in a chip area of 0.45 mm2, with a specific on-resistance of 2.1$\text{m}\Omega \cdot \textsf {cm}^{\textsf {2}}$and a threshold voltage of 1.3 V. Device junction capacitances were characterized and their main components were identified. This was used to calculate the switching charges and practical switching frequencies. Device FOMs were then derived that take into account the trade-offs between the conduction and switching power losses. Our GaN vertical FinFETs exhibit high-frequency (~MHz) switching capabilities and superior switching FOMs when compared with commercial 0.9-1.2-kV Si and SiC power transistors. This letter shows the great potential of GaN vertical FinFETs for next-generation medium-voltage power electronics.
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