砷化镓
扫描隧道显微镜
密度泛函理论
镓
材料科学
光谱学
曲面重建
分子物理学
扫描隧道光谱
砷化物
凝聚态物理
格子(音乐)
化学
光电子学
曲面(拓扑)
纳米技术
计算化学
几何学
物理
数学
量子力学
声学
冶金
作者
Maria Herminia Balgos,Mary Clare Sison Escaño,Rafael Jaculbia,Tien Quang Nguyen,Elizabeth Ann Prieto,Elmer Estacio,Arnel Salvador,Armando Somintac,Masahiko Tani,Norihiko Hayazawa,Yousoo Kim
标识
DOI:10.1002/pssb.202100652
摘要
Using a combination of scanning tunneling microscopy (STM) and spectroscopy with density functional theory calculations, the electronic properties of the subsurface arsenic antisite defect (As Ga ) are unambiguously delineated from those of the surrounding As atoms in undoped gallium arsenide (GaAs) lattice with atomic precision. In the GaAs(110) surface with As Ga located at the second layer (2‐As Ga ), it is found that the midgap state induced by 2‐As Ga manifests as a bright contrast at the As Ga As bond site. Furthermore, it is shown that STM images taken at large magnitudes of negative sample bias are dominated by the local density of states of neighboring surface As atoms. These states lead to a four‐lobe symmetric contrast in the filled‐state STM image around the 2‐As Ga defect. These results provide insights for surface/subsurface defect engineering at the atomic scale.
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