兆位
符号
静态随机存取存储器
宏
航程(航空)
电气工程
算术
数学
拓扑(电路)
物理
计算机科学
离散数学
计算机硬件
材料科学
工程类
程序设计语言
复合材料
作者
Y. Aoyagi,Koji Nii,Makoto Yabuuchi,Tomotaka Tanaka,Yuichiro Ishii,Yoshiaki Osada,Takaaki Nakazato,Isabel Wang,Yu-Hao Hsu,Hong-Chen Cheng,Hung-Jen Liao,Tsung-Yung Jonathan Chang
出处
期刊:IEEE Journal of Solid-state Circuits
[Institute of Electrical and Electronics Engineers]
日期:2024-02-09
卷期号:59 (4): 1225-1234
被引量:1
标识
DOI:10.1109/jssc.2024.3355447
摘要
A 3-nm FinFET single-port (SP) 6T SRAM macro is proposed that utilizes a far-end pre-charge (FPC) circuit and weak-bit (WB) tracking circuit. These circuits can decrease write cycle time by decreasing the pre-charge period and engaging read cycle time by enhancing the trackability of sense enable timing over supply voltage. A prototype of the 434-kbit SP SRAM macro on 3-nm FinFET technology was designed and fabricated. The bit density is 27.6 Mbit/mm2 and it achieved an operation of 1.9 GHz at 0.75 V and 85 °C, which is 35% faster than conventional performance. Measured silicon data demonstrate a wide operating voltage range of 0.48–1.2 V. This proposal has also achieved the best figure of merit (FoM) compared to other works, as defined by density $\times $ access per second (APS)/supply voltage ( $V_{\text {DD}}$ ).
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