Identification of high-temperature resistance to stripe rust and molecular detection of Yr genes in Chinese core collections of common wheat

Stripe rust is a serious wheat disease caused by Puccinia striiformis Westend f. sp. tritici Erikss. High-temperature resistance, which can be induced when the diurnal cycle changes to 15–28 °C or warmer temperatures, has been demonstrated to be non-race specific and durable. The objectives of this study were to evaluate a core collection of 305 Chinese wheat cultivars and landraces for responses to stripe rust in both seedling and adult-plant stages in the greenhouse and the field, determine the distribution of previously reported Yr genes, and select accessions with effective resistance, especially high-temperature resistance. Fifty-eight (19.0%) entries were found to carry all-stage resistance, 71 (23.3%) entries showed adult-plant resistance, 13 (4.3%) entries showed high-temperature all-stage (HTAS) resistance, and 8 (2.6%) entries showed high-temperature adult-plant (HTAP) resistance. Molecular marker detection identified Yr9, Yr10, Yr17, Yr18, Yr26, Yr30, Yr41, Yr78, and Yr80 at different frequencies in the collection, but did not detect Yr5, Yr15, and Yr36. The results in this study would be useful for the rational distribution of cultivars in different regions and breeding for new cultivars with effective and durable resistance.