欧姆接触
激发态
肖特基二极管
纳米电子学
材料科学
光电子学
半导体
联轴节(管道)
肖特基势垒
绝热过程
二极管
纳米技术
凝聚态物理
物理
原子物理学
量子力学
冶金
图层(电子)
作者
Chengfeng Pan,Dazhong Sun,Wang Gong,Lianqiang Xu,Xiuyun Zhang,Anqi Shi,Yongtao Li,Xianghong Niu
出处
期刊:Small methods
[Wiley]
日期:2025-03-27
卷期号:9 (7): e2402037-e2402037
被引量:1
标识
DOI:10.1002/smtd.202402037
摘要
Abstract Rising 2D metal‐semiconductor junctions (MSJs) greatly advance nanoelectronics. Currently, evaluating the performance of MSJs mainly relies on determining the formation of Ohmic or Schottky contacts through static electronic structures. However, when MSJs are integrated into optoelectronic devices, dynamic transport and excited state carrier dynamics become crucial, yet the impact of the interface remains unclear. Herein, taking 2H‐WTe 2 based vertical and lateral MSJs as examples, their performances are evaluated in the perspective of ground and excited states. Faced with the significant band hybridization induced by strong interfacial coupling, identifying Ohmic contact only by analyzing electronic structures possibly becomes defunct. Through quantum transport simulation, the junction with the largest on‐state current can be further filtered. Meanwhile, non‐adiabatic molecular dynamics simulation uncovers the carrier lifetime can be shortened or extended as the interfaces are formed, which depends on the competitive relationship between electron‐phonon coupling and trap states. In these MSJs studied, the photoexcited carriers with the nanosecond lifetime can be rapidly conducted away by electrodes, indicating a high‐effect utilization rate. The work advances the all‐around routine for rational designing and characterizing 2D MSJs.
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