Direct Observation of Structural Defects in Laser-Deposited Superconducting Y-Ba-Cu-O Thin Films

The defect structure of in situ pulsed, laser-deposited, thin films of the high—transition temperature superconductor Y-Ba-Cu-O has been observed directly by atomic resolution electron microscopy. In a thin film with the nominal composition YBa 2 Cu 3 O 7 (123), stacking defects corresponding to the cationic stoichiometry of the 248, 247, and 224 compounds have been observed. Other defects observed include edge dislocations and antiphase boundaries. These defects, which are related to the nonequilibrium processing conditions, are likely to be responsible for the higher critical currents observed in these films as compared to single crystals.