范德瓦尔斯力
材料科学
超晶格
静电力显微镜
堆积
纳米技术
凝聚态物理
化学物理
氮化硼
分子物理学
光电子学
分子
原子力显微镜
化学
物理
有机化学
作者
Stefano Chiodini,James Kerfoot,Giacomo Venturi,Sandro Mignuzzi,Evgeny M. Alexeev,Bárbara Teixeira Rosa,Sefaattin Tongay,Takashi Taniguchi,Kenji Watanabe,Andrea C. Ferrari,Antonio Ambrosio
出处
期刊:ACS Nano
[American Chemical Society]
日期:2022-04-29
卷期号:16 (5): 7589-7604
被引量:31
标识
DOI:10.1021/acsnano.1c11107
摘要
When a twist angle is applied between two layered materials (LMs), the registry of the layers and the associated change in their functional properties are spatially modulated, and a moiré superlattice arises. Several works explored the optical, electric, and electromechanical moiré-dependent properties of such twisted LMs but, to the best of our knowledge, no direct visualization and quantification of van der Waals (vdW) interlayer interactions has been presented, so far. Here, we use tapping mode atomic force microscopy phase-imaging to probe the spatial modulation of the vdW potential in twisted hexagonal boron nitride. We find a moiré superlattice in the phase channel only when noncontact (long-range) forces are probed, revealing the modulation of the vdW potential at the sample surface, following AB and BA stacking domains. The creation of scalable electrostatic domains, modulating the vdW potential at the interface with the environment by means of layer twisting, could be used for local adhesion engineering and surface functionalization by affecting the deposition of molecules or nanoparticles.
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