6.3: A New Method for Hot‐Spot and Mura Quantification and Evaluation in LCD Backlight Units and Panel

Abstract A convenient method to quantificationally and objectively describe the grade of hot‐spot and mura of Liquid Crystal Display is introduced. By converting the spatial backlight unit luminance distribution of a Liquid Crystal Display to frequency domain, Fast Fourier transform is used for luminance variation analysis. The results not only give a factor which can quantificationally describe the grade of hot‐spot and mura of a LCD backlight unit area but also unify different experimental processes that using a camera or a Radiant Imaging ProMetric 1400 system keeping the results consistent.