石墨烯
傅里叶变换红外光谱
拉曼光谱
热重分析
光谱学
材料科学
X射线光电子能谱
氧化物
扫描电子显微镜
红外光谱学
分析化学(期刊)
核化学
化学
化学工程
纳米技术
有机化学
复合材料
光学
物理
工程类
量子力学
冶金
作者
Elvin Aliyev,Volkan Filiz,Muntazim Munir Khan,Young Joo Lee,Clarissa Abetz,Volker Abetz
出处
期刊:Nanomaterials
[Multidisciplinary Digital Publishing Institute]
日期:2019-08-18
卷期号:9 (8): 1180-1180
被引量:399
摘要
The purpose of this work is the structural analysis of graphene oxide (GO) and by means of a new structural model to answer the questions arising from the Lerf-Klinowski and the Lee structural models. Surface functional groups of GO layers and the oxidative debris (OD) stacked on them were investigated after OD was extracted. Analysis was performed successfully using Fourier transform infrared spectroscopy (FTIR), ultraviolet-visible spectroscopy (UV-Vis), X-ray photoemission spectroscopy (XPS), energy-dispersive X-ray spectroscopy (EDX), Raman spectroscopy, solid-state nuclear magnetic resonance spectroscopy (SSNMR), standardized Boehm potentiometric titration analysis, elemental analysis, X-ray diffraction (XRD), thermogravimetric analysis (TGA), scanning electron microscopy (SEM), and transmission electron microscopy (TEM). The analysis showed that graphene oxide layers, as well as oxidative debris contain different functional groups such as phenolic -OH, ketone, lactone, carboxyl, quinone and epoxy. Based on these results, a new structural model for GO layers is proposed, which covers all spectroscopic data and explains the presence of the other oxygen functionalities besides carboxyl, phenolic -OH and epoxy groups.
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