薄膜
钝化
微晶
带隙
硫黄
图层(电子)
蚀刻(微加工)
材料科学
表层
分析化学(期刊)
化学
结晶学
纳米技术
光电子学
冶金
色谱法
作者
Yuhan Cheng,Y. L. Soo,Shiwen Huang,Γ. Κιοσέογλου,Soon Seok Kim,Yi-Han Kao,Bae‐Heng Tseng,Hsueh-HsingHung Dann,Huey-Liang Hwang
标识
DOI:10.7567/jjaps.39s1.379
摘要
The effects of surface alteration on CuInSe 2 thin films by KCN etching and subsequent (NH 4 ) 2 S x sulfur passivation as well as the formation of higher bandgap CuIn(S,Se) 2 layer were investigated. After these chemical treatments, no oxygen uptake was observed and a significant number of sulfur atoms were found to diffuse into the Sb-incoporated CuInSe 2 thin films to form a stable and higher bandgap CuIn(S,Se) 2 layer. A model is proposed to explain how Sb atoms in CuInSe 2 thin films can create a pathway for fast replacement of Se by S atoms. Also, Cu segregation from Cu-rich CuInSe 2 thin films was directly verified for the first time by the experiments of angular dependence of x-ray fluorescence.
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