X射线光电子能谱
分析化学(期刊)
材料科学
电子
薄膜
光谱学
溅射
吸收(声学)
吸收光谱法
原子物理学
化学
核磁共振
光学
物理
纳米技术
量子力学
色谱法
复合材料
作者
Satoshi Yoshio,Keiichi Sato,Kenji Adachi
摘要
The origin of low conductivity and high near-infrared absorption observed in sputtered Cs-polytungstate (CPT) thin films was studied using x-ray photoelectron spectroscopy (XPS), thermal desorption spectroscopy (TDS), and first-principles calculations. The film's resistivity was directly correlated with the intensity of XPS W5+4f peaks, and the mobility of the conduction band (CB) electrons was evaluated as 1.27 × 10−7 cm2 V−1 s−1, both implying the dominance of W5+-trapped electrons in the CB. The presence of H2O residue in the films was detected from XPS O 1s and TDS spectra, suggesting that the incorporation of water upon film deposition induced numerous W/Cs defects reported in Part I. The two representative types of optical profiles were reproduced by first-principles calculations with W-deficient CPT and H2O-incorporated pyrochlore, respectively. We conclude that water-induced W/Cs defects annihilated free electrons in the films, causing loss of conductance and plasma reflection, whereas W5+-trapped electrons generated by O and W vacancies underwent polaronic excitations that generated large near-infrared absorption.
科研通智能强力驱动
Strongly Powered by AbleSci AI