双层石墨烯
扫描隧道显微镜
掺杂剂
双层
石墨烯
兴奋剂
硼
材料科学
堆积
结晶学
纳米技术
电子结构
化学物理
化学
计算化学
光电子学
膜
有机化学
生物化学
作者
Yoshitaka Fujimoto,Susumu Saito
标识
DOI:10.1016/j.susc.2014.11.013
摘要
Abstract First-principles electronic-structure calculations have been performed to investigate energetics and electronic properties of boron (B) and nitrogen (N) defects in bilayer graphene. It is found that the formation energies for N-doped AB -stacked bilayers vary depending on dopant sites, whereas those for B-doped ones show almost site-independent behavior. From results of energy-band structure, B-doped and N-doped bilayer graphenes exhibit p -type and n -type electronic properties, respectively, with carriers on both two layers. It is also found that the boron and the nitrogen defects are observable in scanning tunneling microscopy (STM) images, while AA - and AB -stacking patterns of doped bilayer graphene exhibit similar STM images.
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