离子
电容
材料科学
电荷(物理)
卤化物
萃取(化学)
光电子学
分析化学(期刊)
电极
化学
无机化学
物理
物理化学
色谱法
量子力学
有机化学
作者
Jonas Diekmann,Francisco Peña‐Camargo,Nurlan Tokmoldin,Jarla Thiesbrummel,Jonathan Warby,Emilio Gutierrez‐Partida,Sahil Shah,Dieter Neher,Martin Stolterfoht
标识
DOI:10.1021/acs.jpclett.3c00530
摘要
Mobile ions in perovskite photovoltaic devices can hinder performance and cause degradation by impeding charge extraction and screening the internal field. Accurately quantifying mobile ion densities remains a challenge and is a highly debated topic. We assess the suitability of several experimental methodologies for determining mobile ion densities by using drift-diffusion simulations. We found that charge extraction by linearly increasing voltage (CELIV) underestimates ion density, but bias-assisted charge extraction (BACE) can accurately reproduce ionic lower than the electrode charge. A modified Mott–Schottky (MS) analysis at low frequencies can provide ion density values for high excess ionic densities, typical for perovskites. The most significant contribution to capacitance originates from the ionic depletion layer rather than the accumulation layer. Using low-frequency MS analysis, we also demonstrate light-induced generation of mobile ions. These methods enable accurate tracking of ionic densities during device aging and a deeper understanding of ionic losses.
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