计算机科学
数据传输
频道(广播)
发电机(电路理论)
故障检测与隔离
计算机硬件
实时计算
电子工程
工程类
电信
量子力学
物理
人工智能
功率(物理)
执行机构
作者
Sooryeong Lee,Hayoung Lee,Younwoo Yoo,Seung Ho Shin,Sungho Kang
标识
DOI:10.1109/isocc56007.2022.10031319
摘要
Although high-speed memory testing using low-speed automatic test equipment (ATE) is possible using built-off selfrepair (BOST), there is a problem that the amount of output data is too large to transfer without stall through the slow ATE channel. To solve this problem, a new method called per-row output generator (PROG) is proposed in this paper. Using row fault buffering and reduced output data codes, PROG can efficiently reduce the output data regardless of the fault occurrence pattern in the memory. The additional transmission time required for this method is used within the time budget, and the hardware required for this method is not that large. In addition, the new output data code reduces the channel width between ATE and BOST.
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