Efficient Reliability Testing of Emerging Memory Technologies Using Multiple Radiation Sources

New semiconductor technologies can be difficult and costly to test for radiation reliability. Because the sample space for experiments may be large with new technologies, cost-effect use of specific testing methods can maximize the information obtained while reducing cost. Alternatives to particle accelerator testing are described that can inform later accelerator tests to maximize the use of the available accelerator beam time. Resistive Random Access Memories, a new emerging non-volatile memory, are used as a case study to guide this discussion.