双极结晶体管
晶体管
外延
消散
材料科学
光电子学
扩散
截止频率
硼
图层(电子)
炸薯条
电气工程
化学
纳米技术
物理
工程类
电压
热力学
有机化学
作者
T. Onai,E. Ohue,Y. Idei,M. Tanabe,H. Shimamoto,Katsuyoshi Washio,Takahiro Nakamura
标识
DOI:10.1109/iedm.1993.347398
摘要
Fully symmetrical complementary bipolar transistors for low power-dissipation and ultra-high-speed LSIs have been integrated in the same chip using a 0.3-/spl mu/m SPOTEC process. Reducing the surface concentration of the boron by oxidation at the surface of boron diffusion layer suppressed upward diffusion of boron in the subcollector of the pnp transistor during epitaxial growth. This enabled thin epitaxial layer growth of both npn and pnp transistors simultaneously. Cutoff frequencies of 30 and 32 GHz were obtained in npn and pnp transistors, respectively. These results showed that the power dissipation is reduced to 1/4 in a complementary active pulldown circuit compared with an ECL circuit.< >
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