响应度
暗电流
太赫兹辐射
光探测
光电子学
材料科学
异质结
光电探测器
拓扑绝缘体
石墨烯
电导率
剥脱关节
光子学
光电导性
量子隧道
热辐射计
电阻率和电导率
限制
电子能带结构
传输(电信)
电流(流体)
作者
Tianyu Shu,Zhicheng Lin,Chao Tan,Guohua Hu,Siyuan Luo,Zegao Wang
标识
DOI:10.1002/lpor.202502919
摘要
ABSTRACT The 2D topological insulator Bi 2 Se 3 exhibits a layered structure similar to transition metal dichalcogenides, demonstrating outstanding optoelectronic response properties. However, its high intrinsic conductivity leads to significant dark current, limiting its application in high‐performance photodetectors. This study employed a mechanical exfoliation method to fabricate Bi 2 Se 3 /MoTe 2 III‐type heterojunctions. Leveraging their unique band alignment, a potential barrier formed at the interface effectively suppressed dark current. Under a 1 V bias, the dark current was reduced to 4.9 × 10 − 9 A—five orders of magnitude lower than in single Bi 2 Se 3 devices—and achieved ultra‐wideband photodetection from 405 nm to 0.1 THz without gate voltage. Under 808 nm illumination, the device exhibits a responsivity of 0.59 A/W, a specific detection of 3.27 × 10 8 Jones, and an optical on/off ratio of 23, demonstrating excellent self‐powered characteristics. Mechanism studies indicate that light response in the 405–808 nm band is dominated by direct tunneling, while the 1550 nm and terahertz bands rely on photo‐bolometric effect. This device demonstrates application potential in multi‐wavelength single‐pixel imaging, terahertz transmission imaging, and communications, providing a viable pathway for developing high‐performance, low‐power ultra‐wideband photodetectors.
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