光电探测器
光电子学
范德瓦尔斯力
肖特基势垒
半导体
材料科学
超短脉冲
光电二极管
肖特基二极管
电场
暗电流
欧姆接触
纳米技术
光学
物理
二极管
图层(电子)
量子力学
分子
激光器
作者
Mingjin Dai,Hongyu Chen,Fakun Wang,Mingsheng Long,Huiming Shang,Yunxia Hu,Wen Li,Chuanyang Ge,Jia Zhang,Tianyou Zhai,Yongqing Fu,PingAn Hu
出处
期刊:ACS Nano
[American Chemical Society]
日期:2020-06-30
卷期号:14 (7): 9098-9106
被引量:197
标识
DOI:10.1021/acsnano.0c04329
摘要
Jones and an ultrafast response speed of ∼200 ns, which breaks the response speed limit of reported self-powered photodetectors based on 2D semiconductors. The high sensitivity is achieved by an ultralow dark current noise generated from the robust van der Waals (vdW) Schottky junction and a high photoresponsivity due to the formation of a maximal lateral self-limited depletion region. The ultrafast response time is dominated by the fast carrier drift driven by a strong built-in electric field in the vertical fully depleted channel. This device architecture can help us to design high-performance photodetectors utilizing vdW layered semiconductors.
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