铁电性
材料科学
哈夫尼亚
晶界
表面能
电介质
纳米尺度
曲面(拓扑)
工程物理
边界(拓扑)
纳米技术
化学物理
立方氧化锆
光电子学
微观结构
复合材料
工程类
陶瓷
化学
几何学
数学分析
数学
作者
Min Hyuk Park,Young Hwan Lee,Han‐Joon Kim,Tony Schenk,Woongkyu Lee,Keum Do Kim,Franz P. G. Fengler,Thomas Mikolajick,Uwe Schroeder,Cheol Seong Hwang
出处
期刊:Nanoscale
[Royal Society of Chemistry]
日期:2017-01-01
卷期号:9 (28): 9973-9986
被引量:383
摘要
solid solution thin films of a wide range of film compositions and thicknesses are comprehensively related to the theoretical predictions based on a thermodynamic surface energy model. The theoretical model can semi-quantitatively explain the experimental results on the phase-evolution, but there were non-negligible discrepancies between the two results. To understand these discrepancies, various factors such as the film stress, the role of a TiN capping layer, and the kinetics of crystallization are systematically studied. This work also reports on the evolution of electrical properties of the film, i.e. dielectric, ferroelectric, anti-ferroelectric, and morphotropic phase changes, as a function of the film composition and thickness. The in-depth analyses of the phase change are expected to provide an important guideline for subsequent studies.
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