碳化硅
材料科学
功率半导体器件
电力电子
电气工程
电源模块
晶体管
结温
功率MOSFET
工程物理
高压
MOSFET
半导体器件
光电子学
数码产品
功率(物理)
半导体
电压
工程类
纳米技术
物理
冶金
量子力学
图层(电子)
作者
A.S. Augustine Fletcher,D. Nirmal,J. Ajayan,P. Murugapandiyan
出处
期刊:Current Nanoscience
[Bentham Science Publishers]
日期:2023-12-07
卷期号:21 (1): 37-51
被引量:2
标识
DOI:10.2174/0115734137268803231120111751
摘要
: Due to the magnificent properties of Silicon Carbide (SiC), such as high saturation drift velocity, large operating temperature, higher cut-off and maximum frequency (fT and fmax), high thermal conductivity and large breakdown voltages (BV), it is desirable for high power electronics. With the latest advancements in semiconductor materials and processing technologies, diverse high-power applications such as inverters, power supplies, power converters and smart electric vehicles are implemented using SiC-based power devices. Especially, SiC MOSFETs are mostly used in high-power applications due totheir capability to achieve lower switching loss, higher switching speed and lower ON resistance than the Si-based (Insulated gate bipolar transistor) IGBTs. In this paper, a critical study of SiC MOSFET architectures, emerging dielectric techniques, mobility enhancement methods and irradiation effects are discussed. Moreover, the roadmap of Silicon Carbide power devices is also briefly summarized.
科研通智能强力驱动
Strongly Powered by AbleSci AI