蚀刻(微加工)
钝化
硅
材料科学
图层(电子)
表面光洁度
干法蚀刻
形态学(生物学)
反应离子刻蚀
雕刻
表面粗糙度
光电子学
纳米技术
复合材料
地质学
古生物学
作者
Yiming Ma,Guang Yang,Litian Xu,Zhongwei Jiang,Jing Wang,Donghan Wang,Dong Li
标识
DOI:10.1109/cstic61820.2024.10531958
摘要
The cycli etching process is mainly used for silicon etching, which can achieve a large aepect ratio and selectivity ratio. The article uses CL2/Ar ase the main etching gas, O2 as the passivation gas, and CF4/CHF3 as the gas for opening the bottom of passivation layer. The result show that the silicon sidewall angle ≥ 96°, the silicon sidewall is continuous, and there is no obvious fan-shaped roughness.
科研通智能强力驱动
Strongly Powered by AbleSci AI