响应度
材料科学
钙钛矿(结构)
光电二极管
光电子学
光学
光电探测器
物理
化学
结晶学
作者
Rundong Hu,X. J. Lv,Tong Chen,Bosi Lin,Hang Zhou
标识
DOI:10.1088/1742-6596/2809/1/012057
摘要
Abstract Introducing various absorption materials to the IGZO thin film transistor (TFT) forms new device approach for making high performance photodetectors and image sensors. In this study, a 30 μm × 30 μm IGZO phototransistor with quasi-2D perovskite absorption layer is demonstrated, which attains a high responsivity reaching 1.5 × 10 5 A W −1 and a well detectivity of 3.07 × 10 14 Jones under 87.4 nW cm −2 illumination at 520nm. This approach combines the merits of low turn-off dark current of the IGZO TFT and the high optoelectronic properties of the perovskite photo absorption layer, which is very promising for forming high resolution low cost flat-panel image sensors.
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