绝缘栅双极晶体管
材料科学
上升时间
切换时间
碳化硅
MOSFET
光电子学
脉冲功率
半导体
晶体管
电气工程
电压
可靠性(半导体)
双极结晶体管
纳秒
功率半导体器件
功率(物理)
门驱动器
工程类
光学
物理
冶金
激光器
量子力学
作者
Seung-Ho Song,Jae-Beom Ahn,Hong-Je Ryoo
标识
DOI:10.1109/tps.2022.3198409
摘要
In this study, semiconductor switches are analyzed, compared, and selected for solid-state pulsed power modulators with a high repetitive fast rise time. Characteristics of discharge switches are critical in the design of pulsed power modulators with a fast rise time of several tens of nanoseconds. Five types of switches, including insulated gate bipolar transistor (IGBT) and silicon carbide metal–oxide–semiconductor field-effect transistor (SiC-MOSFET), were analyzed to select a discharge switch in addition to a comparison considering their rise time, arc reliability, and cost. A test circuit was designed and used to compare the rise time of semiconductor switches. Finally, a 1200-V/40-A IGBT was selected as the best performing discharge switch. The rise time and cost of the selected IGBT were up to 30% slower than and 1/6 those of the comparison SiC-MOSFET, respectively. The selected IGBT was employed in a high-voltage pulsed power modulator with specifications of 10 kV, 80 A, a maximum repetition rate of 50 kHz, and a minimum pulsewidth of 100 ns. The modulator exhibited a rise time of 18 ns or less and an operating repetition rate of 50 kHz. Finally, the fast rise time of the selected switch and its arc reliability was verified.
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