Applications of InGaAs near-infrared linear scanning camera in solar cell inspection

An InGaAs near-infrared linear scanning camera was developed based on the InGaAs near-infrared linear detector array, it has a resolution of 256×1 and an adjustable exposure time from 20 μs to 2 ms. The electroluminescence (EL) and photoluminescence (PL) of different kinds of solar cells were observed by the InGaAs near-infrared linear scanning camera and the common used Si-CCD linear scanning camera, and the inspection results of these two cameras were compared. The results show that the InGaAs near-infrared linear scanning camera can obtain a clear image with an exposure time of 2 ms, much faster than the common used Si-CCD linear scanning camera can. Therefore, the InGaAs near-infrared linear scanning camera has the advantage of high efficiency in solar cell inspection.