材料科学
肖特基势垒
宽禁带半导体
金属
光电子学
纳米技术
冶金
二极管
作者
Jiaqi Chen,Zhaofu Zhang,Yuzheng Guo,John Robertson
摘要
The Schottky barrier heights (SBHs) of defect-free interfaces of ZnO, CdO, MgO and SrO with various metals and different terminations are investigated by density functional supercell calculations. The oxide bands are corrected for their density functional band gap error by applying U-type treatment to their metal-d and O-p states where necessary. The p-type SBHs are found to decrease linearly with increasing metal work function. The pinning factor S of the non-polar and polar interfaces are similar for each oxide. S is found to be 0.26, 0.56, 0.74 and 0.96 for CdO, ZnO, MgO and SrO, respectively, with S increasing for increased oxide ionicity. The calculated pinning factors are generally consistent with the metal-induced gap states (MIGS) model in terms of variation with ionicity and dielectric constant. A significant shift of SBHs from the non-polar to the polar interfaces of 0.4 eV, 1 eV and 0.5 eV for ZnO, MgO and SrO, respectively, can be explained by an interfacial dipole. Our results are also useful to describe Co,Fe|MgO interfaces in magnetic tunnel junctions.
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